At the IEEE ISAF-ICE-ISIF-PFM 2025 conference, held July 13–18, 2025, in Graz, Austria, Dr. Qiancheng Zhang presented a breakthrough in high surface potential measurement — Dual Harmonic Kelvin Probe Force Microscopy (DH-KPFM) now capable of measuring surface potentials exceeding 400 volts.
Traditional KPFM techniques, while powerful, typically max out at 10 V and rely on a feedback loop. Dr. Zhang’s work pushes these boundaries by using DH-KPFM—an open-loop, AC-only method that eliminates the need for DC bias and enables measurements in liquid environments or on DC-sensitive materials.
The stiffer cantilevers dramatically increase the max measurable voltage range, with a 247 N/m cantilever successfully detecting up to 432.9 V. This high-voltage capability was further applied to measure pyroelectric coefficients of materials like lithium niobate and TGS.
This advancement opens new doors for nanoscale measurements in high-field materials and extreme conditions. We're now seeking collaborations where high-voltage, liquid-phase, or DC-sensitive surface potential measurements are needed.