| ||||||
| Home Research People Education & Outreach Publications Opportunities Gallery Meet us Contact us | ||||||
PROFESSOR SUZI JARVIS Publications [1] T. P. Weihs, Z. Nawaz, S. P. Jarvis and J. B. Pethica, "Limits of imaging resolution for atomic force microscopy of molecules" Appl. Phys. Lett., 59 (1991) 3536. [2] S. P. Jarvis, T. P. Weihs, A. Oral and J. B. Pethica, "Mechanics of contacts at less than 100Å scale: indentation and AFM", Thin Films - Stresses and mechanical Properties IV, Mater. Res. Soc. Proc. 308 (1993) 127. [3] S. P. Jarvis, A. Oral, T. P. Weihs and J. B. Pethica, "A novel force microscope and point contact probe", Rev. Sci. Inst. 64 (1993) 3515. [4] S. P. Jarvis and J. B. Pethica, "Hydrophobic surface interactions studied using a novel force microscope", in Forces in Scanning Probe Methods, NATO ASI series E: Applied Sciences, Kluwer Academic Publishers. Eds. D.Anselmetti & E.Meyer. p.105. [5] S. P. Jarvis and J. B. Pethica, "Comparison of hydrophobic modifying layers on SiO2 studied with force controlled AFM", Thin Solid Films, 273 (1996) 284-288. [6] S. P. Jarvis, H. Yamada, S.-I. Yamamoto and H. Tokumoto "A new force controlled atomic force microscope for use in ultrahigh vacuum", Rev. Sci. Instrum. 67, 2281 (1996). [7] S. P. Jarvis, H. Yamada, S.-I. Yamamoto, H. Tokumoto and J. B. Pethica "Direct mechanical measurement of interatomic potentials", Nature 384, 247 (1996). [8] S-.I. Yamamoto, H. Yamada, S. P. Jarvis, M. Motomatsu and H. Tokumoto "Detection of similar elastic properties using a magnetic force controlled AFM", Thin Films - Stresses and Mechanical Properties VI, Mater. Res. Soc. Proc. 436, 385 (1997). [9] S. P. Jarvis, S.-I. Yamamoto, H. Yamada, H. Tokumoto and J. B. Pethica "Tip-Surface Interactions Studied Using a Force Controlled Atomic Force Microscope in Ultra High Vacuum", Appl. Phys. Lett. 70, 2238 (1997). [10] S. P. Jarvis and H. Tokumoto "Measurement and interpretation of forces in the atomic force microscope", Invited Review, Probe Microscopy 1, 65 (1997). [11] S. P. Jarvis, U. Dürig, M. A. Lantz, H. Yamada and H. Tokumoto “Feedback stabilized force-sensors: A gateway to the direct measurement of interaction potentials”, Applied Physics A, 66, S211 (1998) [12] S. P. Jarvis, M. A. Lantz, U. Dürig and H. Tokumoto, “Off resonance ac mode force spectroscopy and imaging with an atomic force microscope”, Appl. Surf. Sci. 140, 309 (1999). [13] S. P. Jarvis, M. A. Lantz, H. Ogiso, H. Tokumoto and U. Dürig “Conduction and Mechanical Properties of Atomic Scale Gold Contacts”, Appl. Phys. Lett., 75, 3132 (1999). [14] S. P. Jarvis, H. Tokumoto, H. Yamada, K. Kobayashi and A. Toda “An alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy”, Appl. Phys. Lett., 75, 3883 (1999). [15] M. A. Lantz, S. P. Jarvis, H. Tokumoto, T. Martynski, T. Kusumi, C. Nakamura and J. Miyake “Stretching the a-helix - A direct measure of the hydrogen bond energy of a single peptide molecule”, Chem. Phys. Lett., 315, 61 (1999). [16] S. P. Jarvis, H. Yamada, K. Kobayashi, A. Toda and H. Tokumoto, “Normal and Lateral Force Investigation using Magnetically Activated Force Sensors”, Appl. Surf. Sci., 157, 314 (2000). [17] S. P. Jarvis, T. Uchihashi, T. Ishida, H. Tokumoto and Y. Nakayama, “Local Solvation Shell Measurement in Water using a Carbon Nanotube Probe”, J. Phys. Chem. B, 26, 6091 (2000). [18] S. P. Jarvis, T. Ishida, T. Uchihashi, Y. Nakayama and H. Tokumoto, “Frequency modulation detection Atomic Force Microscopy in the Liquid Environment”, Applied Physics A, 72, S129-S132 (2001). [19] N. D. Spencer and S. P. Jarvis, “Scanning Probe Microscopies” book chapter, Encyclopedia of Chemical Physics and Physical Chemistry, IOP Publishing, Ed. J. H. Moore and N. D. Spencer. (2001) [20] M. A. Lantz, S. P. Jarvis and H. Tokumoto, “High resolution eddy current microscopy”, Appl. Phys. Lett., 86, 383 (2001). [21] M. Kageshima, M. A. Lantz, S. P. Jarvis, H. Tokumoto, S. Takeda, A. Ptak, C. Nakamura, J. Miyake “Insight into conformational changes of a single A-helix peptide molecule through stiffness measurements”, Chem. Phys. Lett., 343, 77-82 (2001). [22] A. Ptak, S. Takeda, C. Nakamura, J. Miyake, M. Kageshima, S. P. Jarvis and H. Tokumoto "A modified atomic force microscope applied to the measurement of elastic modulus for a single peptide molecule" J. Appl. Phys., 90, 3095-3099 (2001). [23] S. Takeda, A. Ptak, C. Nakamura, J. Miyake, M. Kageshima, S. P. Jarvis, H. Tokumoto “Measurement of the length of the alpha helical section of a peptide directly using atomic force microscopy”, Chem. Pharm. Bull. 49, 1512-1516 (2001). [24] S. P. Jarvis, “Adhesion on the Nanoscale” chapter 2, Nanosurface Chemistry, Marcel Dekker Inc., Ed. Morton Rosoff (2002). [25] M. Kageshima, H. Jensenius, M. Dienwiebel, Y. Nakayama, H. Tokumoto, S. P. Jarvis, T. H. Oosterkamp “Noncontact Atomic Force Microscopy in Liquid Environment with Quartz Tuning Fork and Carbon Nanotube Probe” Appl. Surf. Sci., 188, 440-444 (2002). [26] T. Rhodin, K. Umemura, M. Gad, S. P. Jarvis, M. Ishikawa, J. Fu “Exploratory study of RNA polymerase II using dynamic atomic force microscopy”, Applied Surf. Sci. 188, 486-488 (2002). [27] T. Rhodin, J. Fu, K. Umemura, M. Gad, S. P. Jarvis, M. Ishikawa “Single molecule imaging of RNA polymerase II using atomic force microscopy”, Applied Surf. Sci., 210, 105-111 (2003). [28] M. Luna, P.J. de Pablo, J. Colchero, J. Gomez-Herrero, A. M. Baro, H. Tokumoto, S. P. Jarvis “Interaction forces and conduction properties between multi wall carbon nanotube tips and Au (111)” , Ultramicroscopy, 96, 83-92 (2003). [29] S. S. T. Huntington and S. P. Jarvis, “Application of carbon nanotubes to topographical resolution enhancement of tapered fiber SNOM probes”, Rev. Sci. Inst., 74, 2933-2935 (2003). [30] J. E. Sader and S. P. Jarvis, “Accurate Formulas for Interaction Force and Energy in Frequency Modulation Force Spectroscopy”, Appl. Phys. Lett., 84, 1801-1803 (2004). [31] J. E. Sader and S. P. Jarvis, "Interpretation of frequency modulation atomic force microscopy using fractional calculus", Phys. Rev. B, 70, 012303 (2004). [32] T. Uchihashi, M. J. Higgins, S. Yasuda, S. P. Jarvis, S. Akita, Y. Nakayama, and J. E. Sader, "Quantitative force measurements in liquid using frequency modulation atomic force microscopy", App. Phys. Lett., 85, 3575-3577 (2004). [33] M. Kageshima, S. Takeda, Arkadiusz, A. Ptak, C. Nakamura, S.P. Jarvis, H. Tokumoto and J. Miyake, “Measurement of Intramolecular Energy Dissipation and Stiffness of a Single Peptide Molecule by Magnetically Modulated Atomic Force Microscopy”, Japanese Journal of Applied Physics, 43 (2004) Part 2, No. 12A, L1510-L1513. [34] T. Uchihashi, M.J. Higgins, J.E. Sader, S.P. Jarvis, “Quantitative measurement of solvation shells using frequency modulated atomic force microscopy”, Nanotechnology 16 (2005) S40-S53.. [35] J. E. Sader, T. Uchihashi, M. J. Higgins, A. Farrell, Y. Nakayama, and S.P. Jarvis, “Quantitative force measurements using frequency modulation atomic force microscopy – theoretical foundations”, Nanotechnology, 16 (2005) S94-S101. [36] Michael J. Higgins, Christian K. Riener, Takayuki Uchihashi, J.E. Sader, Rachel McKendry and Suzanne P. Jarvis, “Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems”, Nanotechnology, 16 (2005) S85-S89. [37] Alan A. Farrell, Takeshi Fukuma,Takayuki Uchihashi,Euan R. Kay, Giovanni Bottari,David A. Leigh,Hirofumi Yamada, and Suzanne P. Jarvis, “‘Conservative and Dissipative Force Imaging of Switchable Rotaxanes with Frequency Modulation Atomic Force Microscopy”, Physical Review B 72, 125430 (2005). [53] J.G. McGarry, P. Maguire, V.A. Campbell, B.C. O’Connell, P.J. Prendergast and S.P. Jarvis, "Stimulation of nitric oxide mechanotransduction in single osteoblasts using atomic force microscopy", Journal of Orthopedic Research, 26 (4), 513–521 (2008). [54] S.P. Jarvis, John E. Sader and Takeshi Fukuma, “Frequency Modulation Atomic Force Microscopy in Liquids", book chapter, Applied Scanning Probe Methods VIII - Scanning Probe Microscopy Techniques, Springer, Eds. Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (2008). [55] T. Fukuma, A.S. Mostaert, L.C. Serpell, S.P. Jarvis, "Revealing molecular-level surface structure of amyloid fibrils by frequency modulation atomic force microscopy in liquid", Nanotechnology (accepted for publication). [56] G.B. Kaggwa, J.I. Kilpatrick, J.E. Sader, S.P. Jarvis, Artefact-free dynamic atomic force microscopy reveals monotonic dissipation for a simple confined liquid, Applied Physics Letters (accepted for publication). |
||||
Copyright © 2007 www.nanofunction.org Last updated: September 25, 2008 |
![]() |
| ||